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Published: 2026-05-18
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DOI: https://doi.org/10.53747/nst.v14i3.470
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Vol. 14 No. 3 (2024)
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Articles
How to Cite
Nguyen , V. M. T., Nguyen , V. T., Turek, M. ., Drozdziel, A. ., Pyszniak, K. ., Orlov, O. S. ., Sidorin, A. A. ., Nguyen, L. L. ., Pham , T. H., Nguyen , T. N. H., Tran , V. P., Hoang , V. L., Le , T. L., Tran , D. P., Donkov, A. A. ., Popov, E. P. ., Samadov, S. F. ., Mirzayev, M. ., Nguyen , Q. H., & Luu , A. T. (2026). Preliminary analysis of structural defects in thin BiVO4 layer using the slow-positron-beam based facilities at JINR, Dubna. Nuclear Science and Technology, 14(3), 41-50. https://doi.org/10.53747/nst.v14i3.470

Preliminary analysis of structural defects in thin BiVO4 layer using the slow-positron-beam based facilities at JINR, Dubna

Nguyen Vu Minh Trung1,2, Nguyen Van Tiep1,2, Marcin Turek3, Andrzej Drozdziel3, Krzysztof Pyszniak3, Oleg S. Orlov2, Alexey A. Sidorin2, La Ly Nguyen4, Pham Thi Hue4, Nguyen Thi Ngoc Hue4, Tran Van Phuc1, Hoang V. Le5,6, Le Thi Ly5, Tran Dinh Phong5, Alexander. A. Donkov2,7, Evgeni P. Popov2,7,8, Samir F. Samadov9,10,11, M.N. Mirzayev2,10,12, Nguyen Quang Hung13,14, Luu Anh Tuyen4
1 Institute of Physics, Vietnam Academy of Science and Technology
2 Joint Institute for Nuclear Research
3 Institute of Physics, Maria Curie-Skłodowska University in Lublin, M. Curie-Sklodowskiej 1
4 Center for Nuclear Technologies, Vietnam Atomic Energy Institute
5 University of Science and Technology of Hanoi
6 Institute of Science and Technology, TNU-University of Sciences
7 Institute of Solid-State Physics, Bulgarian Academy of Sciences
8 Institute for Nuclear Research and Nuclear Energy, Bulgarian Academy of Sciences
9 Joint Institute for Nuclear Research,
10 Institute of Radiation Problems, Ministry of Science and Education Republic of Azerbaijan
11 Khazar University
12 Khazar University,
13 Institute of Fundamental and Applied Sciences, Duy Tan University
14 Faculty of Natural sciences, Duy Tan University

Main Article Content

Abstract

The present paper introduces the slow-positron beam system at the Joint Institute for Nuclear Research (JINR). Preliminarily studies on thin films using the combined analyses of the variable energy Doppler broadening (VEDB) and variable-energy electron-momentum distribution (VEEMD) measurements at JINR are also reported. These studies provide a unique tool for the in-depth investigations of the structural defects in nanomaterial as thin films, from material’s surface to various depths (in the range from a few nm ups to 1 µm). Application of that method to BiVO4 thin film implanted with P+ ions (200 keV) reveals that the structural defects in the thin film achieve the highest concentration in the depth range of 40 – 200 nm (VEDB analysis), whereas the introduction of P+ ions into the thin film should reduce the positron annihilation probability with high-momentum core electrons. These results open the possibility to use advanced analytical techniques for in-depth study of nanomaterial in JINR, performed, in particular, by Vietnamese scientists.

Article Details

Author Biographies

Nguyen Vu Minh Trung, Institute of Physics, Vietnam Academy of Science and Technology, Joint Institute for Nuclear Research

1Hanoi, 100000, Vietnam

2141980 Dubna, Moscow Reg, Russia,

Nguyen Van Tiep, Institute of Physics, Vietnam Academy of Science and Technology, Joint Institute for Nuclear Research

1Hanoi, 100000, Vietnam

2141980 Dubna, Moscow Reg, Russia,

Marcin Turek, Institute of Physics, Maria Curie-Skłodowska University in Lublin, M. Curie-Sklodowskiej 1

20-03 Lublin, Poland 

Andrzej Drozdziel, Institute of Physics, Maria Curie-Skłodowska University in Lublin, M. Curie-Sklodowskiej 1

20-03 Lublin, Poland 

Krzysztof Pyszniak, Institute of Physics, Maria Curie-Skłodowska University in Lublin, M. Curie-Sklodowskiej 1

20-03 Lublin, Poland 

Oleg S. Orlov, Joint Institute for Nuclear Research

141980 Dubna, Moscow Reg, Russia,

Alexey A. Sidorin, Joint Institute for Nuclear Research

141980 Dubna, Moscow Reg, Russia

La Ly Nguyen, Center for Nuclear Technologies, Vietnam Atomic Energy Institute

Ho Chi Minh City, 70000, Vietnam

Pham Thi Hue, Center for Nuclear Technologies, Vietnam Atomic Energy Institute

Ho Chi Minh City, 70000, Vietnam

Nguyen Thi Ngoc Hue, Center for Nuclear Technologies, Vietnam Atomic Energy Institute

Ho Chi Minh City, 70000, Vietnam

Tran Van Phuc, Institute of Physics, Vietnam Academy of Science and Technology

Hanoi, 100000, Vietnam

Hoang V. Le, University of Science and Technology of Hanoi, Institute of Science and Technology, TNU-University of Sciences

5Vietnam

6Thai Nguyen, Vietnam

Le Thi Ly, University of Science and Technology of Hanoi

Vietnam

Alexander. A. Donkov, Joint Institute for Nuclear Research, Institute of Solid-State Physics, Bulgarian Academy of Sciences

2141980 Dubna, Moscow Reg, Russia,

7Sofia, 1784, Bulgaria

Evgeni P. Popov, Joint Institute for Nuclear Research, Institute of Solid-State Physics, Bulgarian Academy of Sciences, Institute for Nuclear Research and Nuclear Energy, Bulgarian Academy of Sciences

141980 Dubna, Moscow Reg, Russia,

Sofia, 1784, Bulgaria

Sofia, 1784, Bulgaria

Samir F. Samadov, Joint Institute for Nuclear Research,, Institute of Radiation Problems, Ministry of Science and Education Republic of Azerbaijan, Khazar University

141980 Dubna, Moscow Reg, Russia,

Baku, АZ1143, Azerbaijan

AZ1096, Baku, Azerbaijan

M.N. Mirzayev, Joint Institute for Nuclear Research, Institute of Radiation Problems, Ministry of Science and Education Republic of Azerbaijan, Khazar University,

141980 Dubna, Moscow Reg, Russia,

Baku, АZ1143, Azerbaijan

AZ1096, Baku, Azerbaijan

Nguyen Quang Hung, Institute of Fundamental and Applied Sciences, Duy Tan University, Faculty of Natural sciences, Duy Tan University

Ho Chi Minh City 70000, Vietnam

Danang, 55000, Vietnam

Luu Anh Tuyen, Center for Nuclear Technologies, Vietnam Atomic Energy Institute

Center for Nuclear Technologies, Vietnam Atomic Energy Institute, Ho Chi Minh City, 70000, Vietnam

Keywords

Slow-positron beam, variable-energy Doppler broadening (VEDB), variable-energy electron-momentum distribution (VEEMD), JINR, BiVO4 thin film, positron annihilation spectroscopy (PAS)

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