Dang TML, Nguyen NQ, Bui DK, Duong TN, Ho QT, Duong VT, Tran TH, Bui TAD, Pham BN. Characteristics of the reference X-ray narrow-spectrum series at SSDL of Institute for Nuclear Science and Technology. Nucl. Sci. and Tech. [Internet]. 2024Feb.20 [cited 2024Oct.6];12(4):23-8. Available from: http://old.vinatom.gov.vn/index.php/nst/article/view/387