Nguyen , V.M.T., Nguyen , V.T., Turek, M. , Drozdziel, A. , Pyszniak, K. , Orlov, O.S. , Sidorin, A.A. , Nguyen, L.L. , Pham , T.H., Nguyen , T.N.H., Tran , V.P., Hoang , V.L., Le , T.L., Tran , D.P., Donkov, A.A. , Popov, E.P. , Samadov, S.F. , Mirzayev, M. , Nguyen , Q.H. and Luu , A.T. 2026. Preliminary analysis of structural defects in thin BiVO4 layer using the slow-positron-beam based facilities at JINR, Dubna. Nuclear Science and Technology. 14, 3 (May 2026), 41-50. DOI:https://doi.org/10.53747/nst.v14i3.470.